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ENHANCED ELECTRICAL PROPERTIES OF NONSTRUCTURAL CUBIC SILICON CARBIDE WITH GRAPHENE CONTACT FOR PHOTOVOLTAIC APPLICATIONS
Islamia Univ Bahawalpur, Pakistan.
Islamia Univ Bahawalpur, Pakistan.
Islamia Univ Bahawalpur, Pakistan.
Islamia Univ Bahawalpur, Pakistan.
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2020 (English)In: Digest Journal of Nanomaterials and Biostructures, E-ISSN 1842-3582, Vol. 15, no 3, p. 963-972Article in journal (Refereed) Published
Abstract [en]

Cubic silicon carbide (3C-SiC) is successfully synthesized through a simple solid-state reaction technique at a comparatively low temperature without using any catalyst. The XRD data is also used to study other structural parameters of synthesized sample by using different method. Raman peak at 796 cm(-1) supports the XRD results. Si-C vibrational mode observed at 788 cm-1 in the FTIR spectrum further confirms the growth of 3C-SiC. UV-Vis spectroscopy is used to measure optical bandgap energy (E-g = 2.36 eV). Other optical parameters such as dielectric constant and refractive index of grown sample are also studied. Electrical performance is analyzed by using graphene contact with further evaluation of dark and light IV-measurements. The use of graphene contact establishes the enhancement of electrical conductivity of as-grown samples particularly when they are exposed to light. These findings indicate that the grown sample has comparatively better transport properties than conventional metal contacts under the illuminated conditions.

Place, publisher, year, edition, pages
Bucharest, Romania: INST MATERIALS PHYSICS , 2020. Vol. 15, no 3, p. 963-972
Keywords [en]
3C-SiC; Solid-state reaction; Graphene; I-V; XRD; Optical conductivity
National Category
Ceramics and Powder Metallurgical Materials
Identifiers
URN: urn:nbn:se:liu:diva-171364ISI: 000580815200036OAI: oai:DiVA.org:liu-171364DiVA, id: diva2:1500998
Note

Funding Agencies|IRSIP (International research program Initiative program) HEC, Pakistan

Available from: 2020-11-15 Created: 2020-11-15 Last updated: 2025-02-09Bibliographically approved

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Syväjärvi, Mikael
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Semiconductor MaterialsFaculty of Science & Engineering
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