X-ray Photoelectron Fingerprints of High-Valence Ruthenium–Oxo Complexes along the Oxidation Reaction Pathway in an Aqueous EnvironmentShow others and affiliations
2019 (English)In: The Journal of Physical Chemistry Letters, E-ISSN 1948-7185, Vol. 10, no 24, p. 7636-7643Article in journal (Refereed) Published
Abstract [en]
Recent advances in operando-synchrotron-based X-ray techniques are making it possible to address fundamental questions related to complex proton-coupled electron transfer reactions, for instance, the electrocatalytic water splitting process. However, it is still a grand challenge to assess the ability of the different techniques to characterize the relevant intermediates, with minimal interference on the reaction mechanism. To this end, we have developed a novel methodology employing X-ray photoelectron spectroscopy (XPS) in connection with the liquid-jet approach to probe the electrochemical properties of a model electrocatalyst, [RuII(bpy)2(py)(OH2)]2+, in an aqueous environment. There is a unique fingerprint of the extremely important higher-valence ruthenium–oxo species in the XPS spectra along the oxidation reaction pathway. Furthermore, a sequential method combining quantum mechanics and molecular mechanics is used to illuminate the underlying physical chemistry of such systems. This study provides the basis for the future development of in-operando XPS techniques for water oxidation reactions.
Place, publisher, year, edition, pages
American Chemical Society (ACS), 2019. Vol. 10, no 24, p. 7636-7643
National Category
Theoretical Chemistry
Identifiers
URN: urn:nbn:se:liu:diva-189706DOI: 10.1021/acs.jpclett.9b02756ISI: 000503919300014PubMedID: 31747290Scopus ID: 2-s2.0-85075934947OAI: oai:DiVA.org:liu-189706DiVA, id: diva2:1708333
2022-11-032022-11-032025-05-22Bibliographically approved