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Generalised Active Learning With Annotation Quality Selection
Dept. of Electrical Engineering, Chalmers University of Technology, Gothenburg, Sweden.
Linköping University, Department of Computer and Information Science, The Division of Statistics and Machine Learning. Linköping University, Faculty of Arts and Sciences.ORCID iD: 0000-0003-4209-874X
Dept. of Electrical Engineering, Chalmers University of Technology, Gothenburg, Sweden.
Linköping University, Department of Computer and Information Science, The Division of Statistics and Machine Learning. Linköping University, Faculty of Science & Engineering.ORCID iD: 0000-0003-3749-5820
2023 (English)In: IEEE 33rd International Workshop on Machine Learning for Signal Processing (MLSP), IEEE, 2023Conference paper, Published paper (Refereed)
Abstract [en]

In this paper we promote a general formulation of active learning (AL), wherein the typically binary decision to annotate a point or not is extended to selecting the qualities with which the points should be annotated. By linking the annotation quality to the cost of acquiring the label, we can trade a lower quality for a larger set of training samples, which may improve learning for the same annotation cost. To investigate this AL formulation, we introduce a concrete criterion, based on the mutual information (MI) between model parameters and noisy labels, for selecting annotation qualities for the entire dataset, before any labels are acquired. We illustrate the usefulness of our formulation with examples for both classification and regression and find that MI is a good candidate for a criterion, but its complexity limits its usefulness.

Place, publisher, year, edition, pages
IEEE, 2023.
Series
IEEE Workshop on Machine Learning for Signal Processing, ISSN 1551-2541, E-ISSN 2161-0371
Keywords [en]
Training;Costs;Annotations;Conferences;Machine learning;Signal processing;Complexity theory;Active learning;noisy labels;mutual information
National Category
Computer Sciences Probability Theory and Statistics
Identifiers
URN: urn:nbn:se:liu:diva-204030DOI: 10.1109/MLSP55844.2023.10285931ISBN: 979-8-3503-2411-2 (electronic)ISBN: 979-8-3503-2412-9 (print)OAI: oai:DiVA.org:liu-204030DiVA, id: diva2:1863824
Conference
IEEE 33rd International Workshop on Machine Learning for Signal Processing (MLSP), Rome, Italy, 17-20 September, 2023.
Available from: 2024-06-01 Created: 2024-06-01 Last updated: 2025-11-17Bibliographically approved

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Olmin, AmandaLindsten, Fredrik

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CiteExportLink to record
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