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Automatic Testing and Validation of Level of Detail Reductions Through Supervised Learning
Uppsala Univ, Sweden.
Linköping University.
SEED Elect Arts EA, FL USA.
SEED Elect Arts EA, FL USA.
Show others and affiliations
2022 (English)In: 2022 IEEE CONFERENCE ON GAMES, COG, IEEE , 2022, p. 191-198Conference paper, Published paper (Refereed)
Abstract [en]

Modern video games are rapidly growing in size and scale, and to create rich and interesting environments, a large amount of content is needed. As a consequence, often several thousands of detailed 3D assets are used to create a single scene. As each asset's polygon mesh can contain millions of polygons, the number of polygons that need to be drawn every frame may exceed several billions. Therefore, the computational resources often limit how many detailed objects that can be displayed in a scene. To push this limit and to optimize performance one can reduce the polygon count of the assets when possible. Basically, the idea is that an object at farther distance from the capturing camera, consequently with relatively smaller screen size, its polygon count may be reduced without affecting the perceived quality. Level of Detail (LOD) refers to the complexity level of a 3D model representation. The process of removing complexity is often called LOD reduction and can be done automatically with an algorithm or by hand by artists. However, this process may lead to deterioration of the visual quality if the different LODs differ significantly, or if LOD reduction transition is not seamless. Today the validation of these results is mainly done manually requiring an expert to visually inspect the results. However, this process is slow, mundane, and therefore prone to error. Herein we propose a method to automate this process based on the use of deep convolutional networks. We report promising results and envision that this method can be used to automate the process of LOD reduction testing and validation.

Place, publisher, year, edition, pages
IEEE , 2022. p. 191-198
Series
IEEE Conference on Computational Intelligence and Games, ISSN 2325-4270, E-ISSN 2325-4289
Keywords [en]
game testing; machine learning; supervised learning; Visual perception; full-reference image quality assessment; textured mesh; level of detail; evaluation; deep learning
National Category
Other Engineering and Technologies
Identifiers
URN: urn:nbn:se:liu:diva-209541DOI: 10.1109/CoG51982.2022.9893682ISI: 001304089600025ISBN: 9781665459891 (electronic)ISBN: 9781665459907 (print)OAI: oai:DiVA.org:liu-209541DiVA, id: diva2:1913189
Conference
IEEE Conference on Games (CoG), Beijing, PEOPLES R CHINA, aug 21-24, 2022
Available from: 2024-11-14 Created: 2024-11-14 Last updated: 2025-02-18

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CiteExportLink to record
Permanent link

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Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf