liu.seSearch for publications in DiVA
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
An Evaluation of Objective Image Quality Assessment for Thermal Infrared Video Tone Mapping
Hensoldt Optron GmbH, Germany.
Hensoldt Optron GmbH, Germany; Ulm Univ Appl Sci, Germany.
Hensoldt Optron GmbH, Germany.
Linköping University, Department of Science and Technology, Media and Information Technology. Linköping University, Faculty of Science & Engineering.ORCID iD: 0000-0002-9217-9997
Show others and affiliations
2020 (English)In: 2020 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION WORKSHOPS (CVPRW 2020), IEEE COMPUTER SOC , 2020, p. 488-497Conference paper, Published paper (Refereed)
Abstract [en]

State-of-the-art thermal infrared cameras produce high quality images with a bit depth of up to 16 bits per pixel (bpp). In practice, the data often reach a bit depth of 14 bpp, which cannot be displayed naively to a standard monitor that is limited to 8 bpp. Therefore, the dynamic range of these images has to be compressed. This can be done with an operator called tone mapping. There are many methods available for tone mapping, but the quality of the results can be extremely different. In this paper, we discuss and evaluate image quality assessment measures for tone mapping taken from the literature using thermal infrared videos. The usefulness of the measures is analyzed and effectively demonstrated by utilizing various reference Tone Mapping Operators (TMOs) based on traditional algorithm engineering on the one hand and deep learning on the other hand. We conclude that the chosen measures can objectively assess the quality of TMOs in thermal infrared videos.

Place, publisher, year, edition, pages
IEEE COMPUTER SOC , 2020. p. 488-497
Series
IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, ISSN 2160-7508, E-ISSN 2160-7516
National Category
Computer graphics and computer vision
Identifiers
URN: urn:nbn:se:liu:diva-209706DOI: 10.1109/CVPRW50498.2020.00062ISI: 000788279000053ISBN: 9781728193601 (electronic)ISBN: 9781728193618 (print)OAI: oai:DiVA.org:liu-209706DiVA, id: diva2:1913308
Conference
IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), ELECTR NETWORK, jun 14-19, 2020
Available from: 2024-11-14 Created: 2024-11-14 Last updated: 2025-02-07

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full text

Search in DiVA

By author/editor
Eilertsen, Gabriel
By organisation
Media and Information TechnologyFaculty of Science & Engineering
Computer graphics and computer vision

Search outside of DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric score

doi
isbn
urn-nbn
Total: 48 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf